03684nam a22004815i 4500001001800000003000900018005001700027007001500044008004100059020001800100020001900118024003500137040000900172082001700181100003600198245013300234264003800367300002100405336002600426337002600452338003900478347002400517490005400541505120800595520083101803650001702634650001902651650002602670650001702696650002502713650002002738650001702758650002602775650005502801650002002856650005102876650002802927710003402955773002002989776003603009830005403045856010303099978-0-387-74747-7DE-He21320260521091950.0cr nn 008mamaa100301s2008    xxu|    s    |||| 0|eng d  a9780387747477  a997803877474777 a10.1007/978-0-387-74747-72doi  cCICY04a621.38152231 aTehranipoor, Mohammad.eeditor.10aEmerging Nanotechnologiesh[recurso electrónico] :bTest, Defect Tolerance, and Reliability /cedited by Mohammad Tehranipoor. 1aBoston, MA :bSpringer US,c2008.  bonline resource.  atextbtxt2rdacontent  acomputerbc2rdamedia  arecurso en líneabcr2rdacarrier  atext filebPDF2rda1 aFrontiers in Electronic Testing,x0929-1296 ;v370 aTest and Defect Tolerance for Crossbar-Based Architectures -- Defect-Tolerant Logic with Nanoscale Crossbar Circuits -- Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics -- Test and Defect Tolerance for Reconfigurable Nanoscale Devices -- A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology -- Defect Tolerance in Crossbar Array Nano-Architectures -- Test and Defect Tolerance for QCA Circuits -- Reversible and Testable Circuits for Molecular QCA Design -- Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems -- QCA Circuits for Robust Coplanar Crossing -- Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata -- Testing Microfluidic Biochips -- Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems -- Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips -- Reliability for Nanotechnology Devices -- Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields -- Towards Nanoelectronics Processor Architectures -- Design and Analysis of Fault-Tolerant Molecular Computing Systems.  aEmerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field. 0aENGINEERING. 0aSYSTEM SAFETY. 0aCOMPUTER ENGINEERING. 0aELECTRONICS. 0aSYSTEMS ENGINEERING. 0aNANOTECHNOLOGY.14aENGINEERING.24aCIRCUITS AND SYSTEMS.24aELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION.24aNANOTECHNOLOGY.24aQUALITY CONTROL, RELIABILITY, SAFETY AND RISK.24aELECTRICAL ENGINEERING.2 aSpringerLink (Online service)0 tSpringer eBooks08iPrinted edition:z9780387747460 0aFrontiers in Electronic Testing,x0929-1296 ;v3740uhttp://dx.doi.org/10.1007/978-0-387-74747-7zVer el texto completo en las instalaciones del CICY