02518nam a22004695i 4500 978-0-387-26528-5 DE-He213 20260521091840.0 cr nn 008mamaa 100301s2005 xxu| s |||| 0|eng d 9780387265285 99780387265285 10.1007/b137645 doi CICY 621.3815 23 Srivastava, Ashish. author. Statistical Analysis and Optimization for VLSI: Timing and Power [recurso electrónico] / by Ashish Srivastava, Dennis Sylvester, David Blaauw. Boston, MA : Springer US, 2005. IX, 279 p. online resource. text txt rdacontent computer c rdamedia recurso en línea cr rdacarrier text file PDF rda Series on Integrated Circuits and Systems Statistical Models and Techniques -- Statistical Timing Analysis -- Statistical Power Analysis -- Yield Analysis -- Statistical Optimization Techniques. Statistical Analysis and Optimization for VLSI: Timing and Power is the first book summarizing the state-of-the-art in the newly emerging field of statistical computer-aided design (CAD) tools. The very latest research in statistical timing and power analysis techniques is included, along with efforts to incorporate parametric yield as the key objective function during the design process. The emphasis is on algorithms, modeling approaches for process variability, and statistical techniques that are the cornerstone of the probabilistic CAD movement. Statistical Analysis and Optimization for VLSI: Timing and Power will allow new researchers in this area to come up to speed quickly, as well as provide a handy reference for those already working in CAD tool development. ENGINEERING. ELECTRONICS. SYSTEMS ENGINEERING. ENGINEERING. CIRCUITS AND SYSTEMS. ELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION. Sylvester, Dennis. author. Blaauw, David. author. SpringerLink (Online service) Springer eBooks Printed edition: 9780387257389 Series on Integrated Circuits and Systems http://dx.doi.org/10.1007/b137645 Ver el texto completo en las instalaciones del CICY ddc ER 32518 32518 0 0 ddc 0 0 LE CICY CICY EL 2025-07-10 0 621.3815 2025-07-10 08:39:36 2025-07-10 ER