An Introduction to TEM, SEM, and AEM Egerton, Ray F. creator author. SpringerLink (Online service) text xxu 2005 monographic eng

electronic

recurso electrónico

access XII, 202 p. 122 illus. online resource. Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy. An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Recent Developments. by Ray F. Egerton. CHEMISTRY MICROSCOPY NANOTECHNOLOGY SURFACES (PHYSICS) CHEMISTRY CHARACTERIZATION AND EVALUATION OF MATERIALS NANOTECHNOLOGY BIOLOGICAL MICROSCOPY 620.11 9780387260167 99780387260167 http://dx.doi.org/10.1007/b136495 http://dx.doi.org/10.1007/b136495 100301 20260521091838.0 978-0-387-26016-7