02457nam a22004455i 4500 978-0-387-26016-7 DE-He213 20260521091838.0 cr nn 008mamaa 100301s2005 xxu| s |||| 0|eng d 9780387260167 99780387260167 10.1007/b136495 doi CICY 620.11 23 Egerton, Ray F. author. Physical Principles of Electron Microscopy [recurso electrónico] : An Introduction to TEM, SEM, and AEM / by Ray F. Egerton. Boston, MA : Springer US : Imprint: Springer, 2005. XII, 202 p. 122 illus. online resource. text txt rdacontent computer c rdamedia recurso en línea cr rdacarrier text file PDF rda An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Recent Developments. Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy. CHEMISTRY. MICROSCOPY. NANOTECHNOLOGY. SURFACES (PHYSICS). CHEMISTRY. CHARACTERIZATION AND EVALUATION OF MATERIALS. NANOTECHNOLOGY. BIOLOGICAL MICROSCOPY. SpringerLink (Online service) Springer eBooks Printed edition: 9780387258003 http://dx.doi.org/10.1007/b136495 Ver el texto completo en las instalaciones del CICY ddc ER 32454 32454 0 0 ddc 0 0 LE CICY CICY EL 2025-07-10 0 620.11 2025-07-10 08:39:35 2025-07-10 ER