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Statistical Analysis and Optimization for VLSI: Timing and Power [recurso electrónico] / by Ashish Srivastava, Dennis Sylvester, David Blaauw.

By: Contributor(s): Material type: TextSeries: Series on Integrated Circuits and SystemsPublisher: Boston, MA : Springer US, 2005Description: IX, 279 p. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • recurso en línea
ISBN:
  • 9780387265285
  • 99780387265285
Subject(s): Additional physical formats: Printed edition:: No titleDDC classification:
  • 621.3815 23
Online resources:
Contents:
Statistical Models and Techniques -- Statistical Timing Analysis -- Statistical Power Analysis -- Yield Analysis -- Statistical Optimization Techniques.
In: Springer eBooksSummary: Statistical Analysis and Optimization for VLSI: Timing and Power is the first book summarizing the state-of-the-art in the newly emerging field of statistical computer-aided design (CAD) tools. The very latest research in statistical timing and power analysis techniques is included, along with efforts to incorporate parametric yield as the key objective function during the design process. The emphasis is on algorithms, modeling approaches for process variability, and statistical techniques that are the cornerstone of the probabilistic CAD movement. Statistical Analysis and Optimization for VLSI: Timing and Power will allow new researchers in this area to come up to speed quickly, as well as provide a handy reference for those already working in CAD tool development.
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ER CICY LE 621.3815 (Browse shelf(Opens below)) Available

Statistical Models and Techniques -- Statistical Timing Analysis -- Statistical Power Analysis -- Yield Analysis -- Statistical Optimization Techniques.

Statistical Analysis and Optimization for VLSI: Timing and Power is the first book summarizing the state-of-the-art in the newly emerging field of statistical computer-aided design (CAD) tools. The very latest research in statistical timing and power analysis techniques is included, along with efforts to incorporate parametric yield as the key objective function during the design process. The emphasis is on algorithms, modeling approaches for process variability, and statistical techniques that are the cornerstone of the probabilistic CAD movement. Statistical Analysis and Optimization for VLSI: Timing and Power will allow new researchers in this area to come up to speed quickly, as well as provide a handy reference for those already working in CAD tool development.

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